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High-density deletion bin map of wheat D genome

A NimbleGen array containing both gene-based and RJM repeat junction probe sequences derived from Ae. Tauschii was developed and used to map the Chinese Spring nullisomic-tetrasomic lines and deletion bin lines of the D genome chromosomes. Overall design: The NimbleGen array was hybridized in duplicate with Cy3 labeled seven nullisomic-tetrasomic lines, deletion bin lines for D genome chromosomes, and control reference Chinese Spring; as well as Cy5 labeled reference line Chinese Spring.

FieldValue
Tags
Modified
2015-10-21
Release Date
2015-07-21
Identifier
PRJNA290521
Publisher
National Center for Biotechnology Information
License
Other (Public Domain)
Contact Name
BioProject Curation Staff
Contact Email
Public Access Level
Public
Source ID
PRJNA290521
National Center for Biotechnology Information